Field Emission Transmission Electron Microscope (FETEM)

Equipment Details: 

    Make   :  JEOL
    Model  :  2200FS
 
 

Equipment Photo: 
Applications: 

 

Characterization of the good quality specimen on microscopy and spectroscopy aspects such as high resolution imaging (HRTEM), scanning transmission electron microscopy (STEM), selected area electron diffraction (SAED) and electron energy loss spectroscopy (EELS) can be performed.

 

Key Features:

  • Built-in energy filter
  • High contrast imaging
  • No darkroom required with LCD monitor
  • Extensive functions for image processing and computer analysis

 

Important Specifications:

       

Point-image Resolution

0.19nm (200kV)

Accelerating Voltage

up to 200kV

Magnification

x100-1,500,000

Electron gun

ZrO/W (100) Schottky

Camera Length

200-2,000mm

Spectrometer

In-column filter

Spot size

0.2nm

 

Contact Person: 

I). Dr Sunit Rane (Instrument Incharge) Office No: 020-25989273

Email id : sunit@cmet.gov.in

II). Mr.Marimuthu (Characterization Incharge) Office no 020-25989273

Email id : marimuthu@cmet.gov.in

Location: 
Pune Laboratory
Working Principles: 

FETEM combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery and chemical analysis of specimens.

This also utilizes a rotation-free image-forming optical system which not only facilitates acquisition of TEM images and diffraction patterns but also produces stable spectra data.

User Instructions: 

(The samples need to be submitted on carbon coated Cu TEM grids)

Description of Work

a. Type of the Sample (Physical)*

b. Chemical Type

c. Magnetic

d. Analysis possible

 

Powder only

Oxide / Polymer / Composite / Glass / Metal Alloy

Yes / No.   (Magnetic sample analysis is not possible currently)

TEM / EDS / SAED / EELS / STEM